Speed ​​up production and improve inspection! Discover HELIOS microscope

Come to a practical workshop where you will learn how these cutting-edge methods work, how samples are prepared and how results are evaluated. And most importantly, you will see how all this can help you in your production practice.

What is the HELIOS 5 PFIB CXe

A microscope for more than 45 million crowns can display the object under investigation in nanometer resolution and at the same time allows you to look under the surface of the sample under investigation. This can be very well used, for example, for comprehensive analysis of material quality and surface treatments, alloys, weld inspection or when examining material defects.

The microscope was purchased in 2024 thanks to financial support from the Interreg Czech-Saxony program as part of the SUPPORT4SME project. The total value of the equipment is 45.4 million crowns including VAT, of which the research institute covered 20% from its own funds.

What will the workshop bring you?

• you will learn about the basics of FIB-SEM and its benefits for materials research and industry,
  you will gain an overview of key aspects of sample preparation that affect the quality of results,
  you will see a practical demonstration of working on an electron microscope and the possibility of using FIB-SEM,
  you will look into specific case studies from industrial practice,
  and in the informal part you will get a space to exchange experiences and establish contacts.

When and where?

May 6, 2025, 10:00-15:00
CXI – Technical University of Liberec, Bendlova 7

Register, places are limited

Who is the workshop intended for?

For technicians, developers, researchers and specialists from manufacturing companies who want to streamline quality control, are looking for solutions to production problems or are considering product innovation using advanced analytical methods.

We look forward to your participation and sharing experiences together.