Device Laboratory of microscopy

Metallographic ripping saw enabling precise cutting of materials.

Ultra-high resolution scanning electron microscope equipped with Schottky cathode, imaging (SE2, InLens, ESB, AsB) and analytical detectors (EDS, WDS, EBSD) for complex characterization of nanomaterials and structures.

Probe scanning probe microscope (SPM) enabling AFM (atomic force microscopy) and MFM (magnetic force microscopy) modes, 3D characterization and local measurement of surface stiffness and adhesion of biological, metallic and non-metallic preparations in gaseous or liquid environment.

Inverted optical microscope with transmitted light and fluorescent illumination for viewing transparent samples.

Direct optical microscope with reflected light, BF (bright field), DF (dark field), C-DIC (circular differential interference contrast) modes, motorized stage.

Semi-automatic grinding and polishing machine for metallographic samples.

Device for precision polishing of surfaces with Ar ion beam. Two independently adjustable ion cannons at an angle of 0 - 10° and an accelerating voltage of 0.1 - 6 kV. Precision preparation of micro/nano-cuts with ion beam, polishing of samples for EBSD and sample preparation for TEM.

Combined carbon and precious metal sputtering machine, preferably gold, for surface conduction of electrically non-conductive SEM samples. Equipped with a 165mm chamber and a system for measuring the thickness of the deposited layer.

Stereoscopic microscope with digital image recording allowing photodocumentation and subsequent analysis of micro/macrostructures.

Macroscope for routine visual observation of structures.

A basic scanning electron microscope with tungsten cathode for routine, undemanding analysis.