Device Department of advanced materials

Profilometer: measurement of the roughness of the surface and grooves after tests on the tribometer and scratch test

CMS hardness measurement

doc. Ing. Stanislav Petrík, CSc.

Measurement of hardness and other mechanical properties (Young's modulus) of thin (submicron) layers

Dip Coater

Ing. Mateusz Fijalkowski, Ph.D.

Preparation of homogeneous coatings on planar substrates

Charpyho kladivo Zwick HIT50P

doc. Ing. Stanislav Petrík, CSc.

Impact and notch toughness measurements

Chemspeed

Ing. Mateusz Fijalkowski, Ph.D.

Robotic platform for chemical synthesis

Microwave reactor

Ing. Mateusz Fijalkowski, Ph.D.

Hydro and solvothermal synthesis supported by MW field

Oxford Aztec

doc. Ing. Stanislav Petrík, CSc.

Part of SEM
EDS System - AztecEnergy

X-Max detector
Qualitative and quantitative analysis of local chemical composition (from Be to Pu)

WDS System - INCAWave

INCAWave 500
Ultra-precise local chemical composition analysis
Energy range from 0.17 to 10.84 keV

EBSD System - AZtecHKL

HKLNordlysNano
Crystallographic information

Scratch tester Bruker

doc. Ing. Stanislav Petrík, CSc.

Scratch test: measuring the adhesion of thin layers to the substrate

UV-VIS spectroscopy

Ing. Mateusz Fijalkowski, Ph.D.

Identification and structural characterization of organic compounds and determination of inorganic substances

Vacuum deposition chamber - RF PACVD/MS

doc. Ing. Stanislav Petrík, CSc.